Related Experiment Video

Updated: May 19, 2026

Concurrent Quantitative Conductivity and Mechanical Properties Measurements of Organic Photovoltaic Materials using AFM
08:59

Concurrent Quantitative Conductivity and Mechanical Properties Measurements of Organic Photovoltaic Materials using AFM

Published on: January 23, 2013

Quantitative determination of organic semiconductor microstructure from the molecular to device scale

Jonathan Rivnay1, Stefan C B Mannsfeld, Chad E Miller

  • 1Department of Materials Science and Engineering, Stanford University, Stanford, California 94305, USA.

Chemical Reviews
|August 11, 2012
PubMed
Summary

No abstract available in PubMed .

More Related Videos

Using Cyclic Voltammetry, UV-Vis-NIR, and EPR Spectroelectrochemistry to Analyze Organic Compounds11:44

Using Cyclic Voltammetry, UV-Vis-NIR, and EPR Spectroelectrochemistry to Analyze Organic Compounds

Published on: October 18, 2018

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope11:14

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Published on: May 28, 2016

Related Concept Videos