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Updated: May 19, 2026

Implementation of a Reference Interferometer for Nanodetection
Published on: April 26, 2014
High-resolution electronic interferometry for the measurement of in-plane vibration
Ching-Yuan Chang1, Shih-Hao Lin, Chien-Ching Ma
1Mechanical Engineering Department, National Taiwan University, No. 1, Sec. 4, Roosevelt Road, Taipei 10617, Taiwan.
Abstract:
This study proposes an algorithm based on the standard deviation in the temporal domain to remove influences from background noise and ambient disturbance and enhance the quality of images obtained using interferometric technology. From measurements of the first ten in-plane resonant frequencies and mode shapes of vibrating zirconate titanate (PZT) laminates, we investigated the resonant characteristics in both the U and V directions. The resulting interference fringes were used to quantify the vibration amplitude of PZT plates on a submicron scale. The resonant frequencies obtained using the proposed method are in excellent agreement with those obtained using the finite element method and an impedance analyzer.
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