Effective bias removal for fringe projection profilometry using the dual-tree complex wavelet transform.

William Wai-Lam Ng1, Daniel Pak-Kong Lun

  • 1Centre for Signal Processing, Department of Electronic and Information Engineering, The Hong Kong Polytechnic University, Hong Kong, China.

Applied Optics
|August 22, 2012
PubMed
Summary

This study introduces a new method to improve 3D object reconstruction using fringe projection profilometry (FPP). The dual-tree complex wavelet transform (DT-CWT) effectively removes light intensity bias, enhancing 3D model accuracy.

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