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Covalent Attachment of Single Molecules for AFM-based Force Spectroscopy

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Published on: March 16, 2020

On averaging force curves over heterogeneous surfaces in atomic force microscopy.

I Sokolov¹, V Kalaparthi, M Kreshchuk

¹Department of Physics, Clarkson University, Potsdam, NY 13699, USA. sokolov@clarkson.edu

Ultramicroscopy

|August 25, 2012

Summary

Averaging atomic force microscopy (AFM) data simplifies analysis of heterogeneous biological surfaces. Method 2 is more accurate for rigidity but method 1 better captures long-range chemical forces.

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Area of Science:

Nanoscale science
Biophysics
Materials science

Background:

Atomic force microscopy (AFM) is crucial for nanoscale mechanical studies.
Biological and composite surfaces are often heterogeneous, requiring extensive data collection.
Processing individual AFM force curves is time-consuming.

Purpose of the Study:

Investigate averaging techniques for AFM data to save time and resources.
Analyze potential artifacts introduced by data averaging.
Develop methods to minimize or avoid these artifacts.

Main Methods:

Compared two averaging methods: averaging force data over distance (method 1) and averaging distance over force (method 2).
Derived errors for both methods in determining average rigidity modulus.
Examined method accuracy with varying surface rigidity and long-range force heterogeneity.

Main Results:

Both methods show <2% error for low surface rigidity heterogeneity (<50%).
Method 2 underestimates rigidity by 50% for high heterogeneity (>100×), while method 1 has only 15% error.
Method 1 introduces artifacts in long-range force analysis, whereas method 2 accurately derives averaged long-range force parameters.

Conclusions:

Averaging AFM data offers a time-saving alternative to individual curve analysis.
Method 2 is preferred for rigidity measurements on heterogeneous surfaces.
Method 1 is suitable for analyzing averaged long-range forces, avoiding artifacts seen with method 2.