Imaging soft matters in water with torsional mode atomic force microscopy

Ing-Shouh Hwang1, Chih-Wen Yang, Ping-Hsiang Su

  • 1Institute of Physics, Academia Sinica, 128 Sec. 2 Academia Rd., Nankang, Taipei, Taiwan, ROC.

Ultramicroscopy
|September 4, 2012
PubMed
Summary

We developed a high-sensitivity atomic force microscopy (AFM) mode for imaging soft materials in water. This torsional resonance mode achieves high resolution, even with larger tips, enabling detailed surface analysis in various solution conditions.