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Published on: October 17, 2016
Discrimination of field components in optical probe microscopy
D C Kohlgraf-Owens1, S Sukhov, A Dogariu
1CREOL, College of Optics and Photonics, University of Central Florida, Orlando, Florida 32816, USA.
Abstract:
We demonstrate that the conventional optical signal in near-field scanning optical microscopy and the optical force induced topography contain complementary information about the complex three-dimensional field distribution. Crucially, the additional information about the field distribution can be retrieved without increasing the measurement complexity.
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