Uncertainty in Measurement: Reading Instruments
Uncertainty in Measurement: Accuracy and Precision
Propagation of Uncertainty from Systematic Error
Propagation of Uncertainty from Random Error
Uncertainty: Confidence Intervals
Uncertainty: Overview
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Split Point Analysis and Uncertainty Quantification of Thermal-Optical Organic/Elemental Carbon Measurements
Published on: September 7, 2019
Nien Fan Zhang1, Richard M Silver, Hui Zhou
1Statistical Engineering Division, National Institute of Standards and Technology, 100 Bureau Drive MS 8980, Gaithersburg, Maryland 20899, USA. zhang@nist.gov
This study introduces a hybrid metrology approach combining optical measurements with techniques like atomic force microscopy. This Bayesian method reduces uncertainty in critical dimension measurements for nanometer-scale features.
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