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Breakdown characteristics of high-side lateral double-diffused metal oxide semiconductor devices

Kunsik Sung1, Kwangsik Kim, Taeyoung Won

  • 1Department of Electrical Engineering, School of IT Engineering Inha University, Incheon, 402-751, Korea.

Journal of Nanoscience and Nanotechnology
|September 13, 2012
PubMed

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