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In Situ Transmission Electron Microscopy with Biasing and Fabrication of Asymmetric Crossbars Based on Mixed-Phased a-VOx
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In Situ Transmission Electron Microscopy with Biasing and Fabrication of Asymmetric Crossbars Based on Mixed-Phased a-VOx

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Phenomenological analysis of random telegraph noise in amorphous TiOx-based bipolar resistive switching random access

Jung-Kyu Lee1, Ju-Wan Lee, Jong-Ho Bae

  • 1School of Electrical Engineering and Computer Science (EECS) and Inter-University Semiconductor Research Center (ISRC), Seoul National University, Seoul 151-742, Republic of Korea.

Journal of Nanoscience and Nanotechnology
|September 13, 2012
PubMed

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