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Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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Related Experiment Video

Updated: May 18, 2026

Investigating Single Molecule Adhesion by Atomic Force Spectroscopy
09:48

Investigating Single Molecule Adhesion by Atomic Force Spectroscopy

Published on: February 27, 2015

Bond-order discrimination by atomic force microscopy.

Leo Gross1, Fabian Mohn, Nikolaj Moll

  • 1IBM Research-Zurich, CH-8803 Rüschlikon, Switzerland. lgr@zurich.ibm.com

Science (New York, N.Y.)
|September 18, 2012
PubMed
Summary
This summary is machine-generated.

High-resolution atomic force microscopy (AFM) using a carbon monoxide (CO)-functionalized tip can distinguish carbon-carbon bond orders in polycyclic aromatic hydrocarbons and fullerenes. This technique reveals bond order through Pauli repulsion and CO tip tilting effects in AFM images.

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Last Updated: May 18, 2026

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Area of Science:

  • * Surface science
  • * Chemical physics
  • * Materials science

Background:

  • * Polycyclic aromatic hydrocarbons (PAHs) and fullerenes are crucial carbon-based materials with diverse electronic properties.
  • * Characterizing the precise nature of chemical bonds within these molecules is essential for understanding their reactivity and functionality.
  • * Atomic Force Microscopy (AFM) offers high-resolution surface imaging but distinguishing subtle electronic differences, like bond order, remains challenging.

Purpose of the Study:

  • * To demonstrate the capability of noncontact atomic force microscopy (AFM) with a functionalized tip to differentiate carbon-carbon bond orders.
  • * To elucidate the physical mechanisms behind the observed contrast variations in AFM images related to bond order.
  • * To validate experimental findings using theoretical calculations.

Main Methods:

  • * Noncontact atomic force microscopy (AFM) utilizing a carbon monoxide (CO)-functionalized tip.
  • * High-resolution imaging of polycyclic aromatic hydrocarbons (PAHs) and fullerenes.
  • * Density functional theory (DFT) calculations for theoretical validation.

Main Results:

  • * AFM imaging with a CO-functionalized tip successfully distinguished varying carbon-carbon bond orders.
  • * Two contrast mechanisms were identified: increased Pauli repulsion at higher bond orders enhanced image brightness.
  • * Apparent bond length in AFM images decreased with increasing bond order due to CO tip apex tilting.

Conclusions:

  • * CO-functionalized AFM is a powerful tool for probing electronic structure at the nanoscale.
  • * The interplay of Pauli repulsion and tip-molecule geometry dictates AFM contrast for bond order differentiation.
  • * This method provides new insights into the chemical bonding of complex carbon materials.