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Updated: May 18, 2026

Highly Sensitive and Rapid Fluorescence Detection with a Portable FRET Analyzer
Published on: October 1, 2016
A versatile detector for total fluorescence and electron yield experiments
N Thielemann1, P Hoffmann, A Föhlisch
1Institute for Methods and Instrumentation for Synchrotron Radiation Research, Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Albert-Einstein-Str. 15, 12489 Berlin, Germany. nele.thielemann@helmholtz-berlin.de
Abstract:
The combination of a non-coated silicon photodiode with electron repelling meshes makes a versatile detector for total fluorescence yield and electron yield techniques highly suitable for x-ray absorption spectroscopy. In particular, a copper mesh with a bias voltage allows to suppress or transmit the electron yield signal. The performance of this detection scheme has been characterized by near edge x-ray absorption fine structure studies of thermal oxidized silicon and sapphire. The results show that the new detector probes both electron yield and for a bias voltage exceeding the maximum photon energy the total fluorescence yield.
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