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Highly Sensitive and Rapid Fluorescence Detection with a Portable FRET Analyzer

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A versatile detector for total fluorescence and electron yield experiments.

N Thielemann¹, P Hoffmann, A Föhlisch

¹Institute for Methods and Instrumentation for Synchrotron Radiation Research, Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Albert-Einstein-Str. 15, 12489 Berlin, Germany. nele.thielemann@helmholtz-berlin.de

The Review of Scientific Instruments

|October 2, 2012

Summary

This summary is machine-generated.

A novel detector combining a silicon photodiode and electron repelling meshes offers versatile detection for X-ray absorption spectroscopy. This system effectively measures both electron yield and total fluorescence yield signals.

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Area of Science:

Materials Science
Surface Science
Spectroscopy

Background:

X-ray absorption spectroscopy (XAS) is crucial for material analysis.
Existing detectors have limitations in versatility for different yield techniques.
Electron yield and total fluorescence yield are key signals in XAS.

Purpose of the Study:

To develop and characterize a versatile detector for XAS.
To enable simultaneous or selective measurement of electron yield and total fluorescence yield.
To assess the detector's performance using near edge X-ray absorption fine structure (NEXAFS).

Main Methods:

Utilized a non-coated silicon photodiode combined with electron repelling meshes.
Incorporated a biased copper mesh to control electron yield signal transmission.
Performed NEXAFS studies on thermal oxidized silicon and sapphire samples.

Main Results:

The detector successfully probes both electron yield and total fluorescence yield.
A biased copper mesh allows for suppression or transmission of the electron yield signal.
The detector's performance was validated through NEXAFS measurements.

Conclusions:

The developed detector is a versatile tool for XAS, suitable for both electron yield and total fluorescence yield measurements.
The biased mesh provides effective control over signal detection.
This technology enhances the capabilities of X-ray absorption spectroscopy analysis.