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Using Synchrotron Radiation Microtomography to Investigate Multi-scale Three-dimensional Microelectronic Packages
Published on: April 13, 2016
1X-ray Imaging Center, Pohang University of Science and Technology, San 31, Hyoja-dong, Pohang 790-784, South Korea.
A new microtomography system achieves high-resolution, high-speed imaging using advanced X-ray technology. This breakthrough enables rapid visualization of dynamic processes, such as rising bubbles in liquids.
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