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Updated: May 4, 2026

Atom Probe Tomography Studies on the CuIn,GaSe2 Grain Boundaries
Published on: April 22, 2013
Dinh Loc Duong1, Gang Hee Han, Seung Mi Lee
1Sungkyunkwan Advanced Institute of Nanotechnology, Sungkyunkwan University, Suwon 440-746, South Korea.
This study introduces an optical microscopy method to visualize large-area graphene grain boundaries without sample transfer. The technique reveals how these boundaries impact electrical properties and mechanical integrity, offering a new tool for materials science.
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