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High numerical aperture reflection mode coherent diffraction microscopy using off-axis apertured illumination.

Dennis F Gardner1, Bosheng Zhang, Matthew D Seaberg

  • 1JILA, University of Colorado, 440 UCB, Boulder, Colorado 80309-0440, USA. dennis.gardner@colorado.edu

Optics Express
|October 6, 2012
PubMed
Summary
This summary is machine-generated.

We developed a new method for high numerical aperture reflection imaging using coherent diffraction imaging (CDI). This technique significantly speeds up image reconstruction and enables rapid, high-resolution imaging of various samples.

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Area of Science:

  • Optics and Photonics
  • Materials Science
  • Imaging Techniques

Background:

  • Coherent diffraction imaging (CDI) is a powerful lensless imaging technique.
  • Traditional CDI methods often face limitations in achieving high numerical apertures and reflection mode geometries.
  • Developing advanced CDI techniques is crucial for high-resolution nanoscale imaging.

Purpose of the Study:

  • To extend coherent diffraction imaging (CDI) to high numerical aperture (NA) reflection mode.
  • To develop a novel coordinate transform for efficient image reconstruction.
  • To enable rapid, high-NA imaging of samples using visible light and explore its potential with high harmonic beams.

Main Methods:

  • Derivation of a coordinate transform to convert far-field scatter patterns into uniformly spaced Fourier transforms.
  • Implementation of apertured illumination CDI to overcome the isolated sample requirement.
  • Iterative phase retrieval algorithms combined with Fast Fourier Transforms (FFTs) for accelerated image reconstruction.
  • Demonstration of imaging with visible laser light and high harmonic beams.

Main Results:

  • Successful extension of CDI to high numerical aperture reflection mode.
  • Significant acceleration of image reconstruction times through the novel coordinate transform and FFTs.
  • Demonstration of rapid high-NA imaging of samples using apertured illumination CDI with visible light.
  • Proof-of-concept imaging using high harmonic beams for future applications.

Conclusions:

  • The developed coordinate transform and apertured illumination CDI enable rapid, high-NA reflection mode imaging.
  • This technique offers a significant advancement for nanoscale imaging applications.
  • The method shows promise for future developments, including the use of advanced light sources like high harmonic beams.