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Updated: May 17, 2026

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Targeted Studies Using Serial Block Face and Focused Ion Beam Scan Electron Microscopy
Published on: August 10, 2019
Serial block-face scanning electron microscopy combined with double-axis electron beam tomography provides new
Microscopy (Oxford, England)
|October 20, 2012
Abstract:
To evaluate the advantages of combination of two advanced electron microscopic technologies such as serial block-face scanning electron microscopy and double-axis electron beam tomography, we analyzed the three-dimensional morphology of cellular relationships between dendritic and plasma cells in the synovial membrane from patients with rheumatoid arthritis, using the combined approach.
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