Complete polarization analysis of an APPLE II undulator using a soft X-ray polarimeter

Two APPLE II undulators installed on the Diamond I10 beamline have all four magnet arrays shiftable and thus can generate linear polarization at any arbitrary angle from 0° to 180°, as well as all other states of elliptical polarization. To characterize the emitted radiation polarization state from one APPLE II undulator, the complete polarization measurement was performed using a multilayer-based soft X-ray polarimeter. The measurement results appear to show that the linear polarization angle offset is about 6° compared with other measurements at 712 eV, equivalent to an undulator jaw phase offset of 1.1 mm. In addition, the polarization states of various ellipticities have also been measured as a function of the undulator row phase.