Determination of Crystal Structures
X-ray Imaging
Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation
Super-resolution Fluorescence Microscopy
Electron Microscope Tomography and Single-particle Reconstruction
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Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
Published on: August 25, 2016
Taiki Hoshino1, Moriya Kikuchi, Daiki Murakami
1ERATO, Takahara Soft Interfaces Project, Japan Science and Technology Agency, Kyushu University, Nishi-ku, Fukuoka, Japan. t-hoshino@cstf.kyushu-u.ac.jp
A new detector setup using a grid mask enhances X-ray photon correlation spectroscopy (XPCS) for studying fast microscopic dynamics in materials like silica nanoparticles.
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