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Updated: May 17, 2026
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Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
Published on: June 19, 2018
A 30 nm-resolution hard X-ray microscope with X-ray fluorescence mapping capability at BSRF
Qingxi Yuan1, Kai Zhang, Youli Hong
1Beijing Synchrotron Radiation Facility, Institute of High Energy Physics, Chinese Academy of Sciences, Beijing, People's Republic of China.
Journal of Synchrotron Radiation
|October 25, 2012
Summary
A new full-field transmission X-ray microscope (TXM) offers high spatial resolution for advanced materials analysis. This advanced X-ray microscope provides detailed elemental mapping for trace element detection.
Area of Science:
- Materials Science
- Synchrotron Radiation Physics
- Microscopy
Background:
- First-generation synchrotron radiation facilities provide essential infrastructure for advanced scientific instrumentation.
- Transmission X-ray microscopy (TXM) is a powerful technique for high-resolution imaging.
- Fluorescence mapping capability enhances TXM for elemental analysis.
Purpose of the Study:
- To design and construct a versatile full-field transmission X-ray microscope (TXM).
- To achieve high spatial resolution for imaging.
- To integrate fluorescence mapping for trace element detection.
Main Methods:
- Development of a TXM operating from 5 keV to 12 keV.
- Utilizing a Siemens star pattern for spatial resolution testing.
- Implementing scanning-probe mode fluorescence mapping.
Main Results:
- Demonstrated spatial resolution better than 30 nm in absorption and phase-contrast modes.
- Achieved 50 p.p.m. sensitivity for trace elements.
- Obtained 20 µm spatial resolution in fluorescence mapping.
Conclusions:
- The designed TXM meets performance goals for high-resolution imaging and elemental analysis.
- The integrated fluorescence mapping capability enables sensitive trace element detection.
- This instrument advances capabilities at the Beijing Synchrotron Radiation Facility.
