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Updated: May 17, 2026

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
Published on: January 19, 2018
A scanning tunneling microscope with a scanning range from hundreds of micrometers down to nanometer resolution
Fatih Kalkan1, Christopher Zaum, Karina Morgenstern
1Institut für Festkörperphysik, Abteilung ATMOS, Leibniz Universität Hannover, Appelstr. 2, D-30167 Hannover, Germany.
Abstract:
A beetle type stage and a flexure scanning stage are combined to form a two stages scanning tunneling microscope (STM). It operates at room temperature in ultrahigh vacuum and is capable of scanning areas up to 300 μm × 450 μm down to resolution on the nanometer scale. This multi-scale STM has been designed and constructed in order to investigate prestructured metallic or semiconducting micro- and nano-structures in real space from atomic-sized structures up to the large-scale environment. The principle of the instrument is demonstrated on two different systems. Gallium nitride based micropillars demonstrate scan areas up to hundreds of micrometers; a Au(111) surface demonstrates nanometer resolution.
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