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Updated: May 17, 2026

Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
Published on: August 25, 2016
Methods for characterizing x-ray detectors for use at the National Ignition Facility
S F Khan1, L R Benedetti, D R Hargrove
1Lawrence Livermore National Laboratory, Livermore, California 94550, USA. khan9@llnl.gov
Correcting gated x-ray detector gain variations at the National Ignition Facility (NIF) is crucial. A new pulsed x-ray source, with reduced jitter, shows promise for calibrating these essential x-ray diagnostic instruments.
Area of Science:
- High-energy-density physics
- Plasma physics
- X-ray detection technology
Background:
- Gated and streaked x-ray detectors require corrections for instrumental effects.
- Gain variations in gated cameras at the National Ignition Facility (NIF) necessitate calibration.
- Current characterization methods involve dedicated laser-plasma shots at NIF.
Purpose of the Study:
- To describe methods for correcting gain variations in NIF gated x-ray cameras.
- To introduce a recently commissioned pulsed x-ray source for detector characterization.
- To evaluate the potential of this new source as an alternative to existing techniques.
Main Methods:
- Characterization of gated x-ray detectors using four distinct techniques.
- Utilizing laser-generated plasmas for controlled x-ray emission at NIF.
- Employing a new pulsed x-ray source (Marx generator, capacitor bank, up to 300 kV) for characterization.
Main Results:
- A new pulsed x-ray source has been commissioned, offering potential replacement for current characterization systems.
- Initial jitter of the pulsed x-ray source (∼60 ns) was significantly reduced to ∼5 ns by incorporating a pulsed laser trigger.
- The pulsed x-ray source demonstrates promising results as an alternative to traditional flat fielding techniques.
Conclusions:
- The developed pulsed x-ray source is a viable and promising alternative for calibrating gated x-ray detectors.
- Reducing jitter in the pulsed x-ray source enhances its reliability for detector characterization.
- This advancement contributes to more accurate data acquisition from x-ray diagnostics at NIF.
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