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Updated: May 17, 2026

Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
Published on: August 25, 2016
Simultaneous imaging electron- and ion-feature Thomson scattering measurements of radiatively heated Xe
B B Pollock1, J Meinecke, S Kuschel
1Lawrence Livermore National Laboratory, Livermore, California 94550, USA. pollock6@llnl.gov
Abstract:
Uniform density and temperature Xe plasmas have been produced over >4 mm scale-lengths using x-rays generated in a cylindrical Pb cavity. The cavity is 750 μm in depth and diameter, and is heated by a 300 J, 2 ns square, 1054 nm laser pulse focused to a spot size of 200 μm at the cavity entrance. The plasma is characterized by simultaneous imaging Thomson scattering measurements from both the electron and ion scattering features. The electron feature measurement determines the spatial electron density and temperature profile, and using these parameters as constraints in the ion feature analysis allows an accurate determination of the charge state of the Xe ions. The Thomson scattering probe beam is 40 J, 200 ps, and 527 nm, and is focused to a 100 μm spot size at the entrance of the Pb cavity. Each system has a spatial resolution of 25 μm, a temporal resolution of 200 ps (as determined by the probe duration), and a spectral resolution of 2 nm for the electron feature system and 0.025 nm for the ion feature system. The experiment is performed in a Xe filled target chamber at a neutral pressure of 3-10 Torr, and the x-rays produced in the Pb ionize and heat the Xe to a charge state of 20±4 at up to 200 eV electron temperatures.
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