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Updated: May 17, 2026

Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
Published on: August 25, 2016
Tangential x-ray imaging crystal spectrometer on J-TEXT tokamak
1State Key Laboratory of Advanced Electromagnetic Engineering and Technology, College of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan 430074, People's Republic of China.
A new X-ray imaging crystal spectrometer (XICS) measures ion temperature and plasma rotation in the J-TEXT tokamak. This advancement aids fusion energy research by providing crucial plasma diagnostics.
Area of Science:
- Plasma Physics
- Fusion Energy Research
- X-ray Spectroscopy
Background:
- Accurate measurement of plasma properties like ion temperature and toroidal rotation velocity is critical for understanding and controlling fusion plasmas.
- The J-TEXT tokamak requires advanced diagnostic tools to probe these parameters effectively.
Purpose of the Study:
- To develop and implement a tangential X-ray Imaging Crystal Spectrometer (XICS) for the J-TEXT tokamak.
- To enable the measurement of ion temperature and plasma toroidal rotation velocity using XICS.
Main Methods:
- Utilized a spherically bent quartz crystal (2d = 4.913 Å) for spectral dispersion.
- Employed a multi-wire proportional counter for X-ray detection.
- Designed XICS for tangential observation (27°) of Ar XVII emission lines (3.94 Å-4.0 Å) with spatial resolution.
Main Results:
- Successfully developed a tangential XICS system for the J-TEXT tokamak.
- The system is capable of detecting Ar XVII resonance line and satellites.
- Achieved a spatial resolution of 3.1 cm in the vertical direction for plasma measurements.
Conclusions:
- The developed tangential XICS is a viable diagnostic tool for J-TEXT.
- This instrument provides essential data for ion temperature and toroidal rotation velocity measurements.
- The XICS contributes to advancing plasma diagnostics in fusion research.
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