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Updated: May 16, 2026

Characterization of Nanocrystal Size Distribution using Raman Spectroscopy with a Multi-particle Phonon Confinement Model
Published on: August 22, 2015
Composition profiling of inhomogeneous SiGe nanostructures by Raman spectroscopy
Andrea Picco1, Emiliano Bonera, Fabio Pezzoli
1L-NESS, Dipartimento di Scienza dei Materiali, Università degli Studi di Milano-Bicocca, via Cozzi 53, Milan 20125, Italy. emiliano.bonera@unimib.it.
Abstract:
In this work, we present an experimental procedure to measure the composition distribution within inhomogeneous SiGe nanostructures. The method is based on the Raman spectra of the nanostructures, quantitatively analyzed through the knowledge of the scattering efficiency of SiGe as a function of composition and excitation wavelength. The accuracy of the method and its limitations are evidenced through the analysis of a multilayer and of self-assembled islands.
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