Related Experiment Video
Updated: May 16, 2026

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
Published on: April 1, 2020
Integrated spectral-polarization imaging sensor with aluminum nanowire polarization filters
Meenal Kulkarni1, Viktor Gruev
1Department of Computer Science and Engineering, Washington University in Saint Louis, One Brookings Drive, Saint Louis, Missouri 63130, USA. mkulkarni@go.wustl.edu
Abstract:
Current division-of-focal-plane polarization imaging sensors can perceive intensity and polarization in real time with high spatial resolution, but are oblivious to spectral information. We present the design of such a sensor, which is also spectrally selective in the visible regime. We describe its extensive spectral and polarimetric characterization. The sensor has a pixel pitch of 5 µm and an imaging array of 168 by 256 elements. Each element comprises spectrally sensitive vertically stacked photodetectors integrated with a 140 nm pitch nanowire linear polarizer. The sensor has a maximum measured SNR of 45 dB, extinction ratio of ~3.5, QE of 12%, and linearity error of 1% in the green channel. We present sample spectral-polarization images.

