Integrated spectral-polarization imaging sensor with aluminum nanowire polarization filters
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Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
Published on: April 1, 2020
Meenal Kulkarni1, Viktor Gruev
1Department of Computer Science and Engineering, Washington University in Saint Louis, One Brookings Drive, Saint Louis, Missouri 63130, USA. mkulkarni@go.wustl.edu
Abstract:
Current division-of-focal-plane polarization imaging sensors can perceive intensity and polarization in real time with high spatial resolution, but are oblivious to spectral information. We present the design of such a sensor, which is also spectrally selective in the visible regime. We describe its extensive spectral and polarimetric characterization. The sensor has a pixel pitch of 5 µm and an imaging array of 168 by 256 elements. Each element comprises spectrally sensitive vertically stacked photodetectors integrated with a 140 nm pitch nanowire linear polarizer. The sensor has a maximum measured SNR of 45 dB, extinction ratio of ~3.5, QE of 12%, and linearity error of 1% in the green channel. We present sample spectral-polarization images.

