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Automation of Mode Locking in a Nonlinear Polarization Rotation Fiber Laser through Output Polarization Measurements
14:18

Automation of Mode Locking in a Nonlinear Polarization Rotation Fiber Laser through Output Polarization Measurements

Published on: February 28, 2016

Full polarization optical profilometry.

S Arhab1, H Giovannini, K Belkebir

  • 1Institut Fresnel (CNRS UMR 7249), Aix-Marseille Université, Campus de St Jérôme, 13013 Marseille, France. slimane.arhab@fresnel.fr

Journal of the Optical Society of America. A, Optics, Image Science, and Vision
|December 4, 2012
PubMed
Summary
This summary is machine-generated.

Optical digital tomographic microscopy improves surface profilometry using an iterative inverse wave scattering method. Combining both polarization cases significantly enhances lateral resolution and robustness to noise in surface profile determination.

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Area of Science:

  • Optics
  • Surface Metrology
  • Computational Physics

Background:

  • Surface profilometry is crucial for material characterization.
  • Traditional methods face limitations in resolution and accuracy, especially for complex surfaces.
  • Diffraction theories have limitations in describing non-perturbative scattering regimes.

Purpose of the Study:

  • To enhance surface profilometry using optical digital tomographic microscopy.
  • To investigate the role of polarization in inverse wave scattering for surface profiling.
  • To improve the lateral resolution and robustness of surface profile estimation.

Main Methods:

  • Utilizing optical digital tomographic microscopy for surface profilometry.
  • Employing an iterative inverse wave scattering numerical method for profile determination.
  • Analyzing the impact of two fundamental polarization cases on multiple scattering interactions.

Main Results:

  • Demonstrated that different polarization cases interact at different distances during multiple scattering.
  • Showcased a considerable improvement in lateral resolution by incorporating both polarization cases in the inversion process.
  • Evaluated and discussed the method's robustness to noise.

Conclusions:

  • Combining both polarization cases in the iterative inverse wave scattering method significantly improves lateral resolution in surface profilometry.
  • Optical digital tomographic microscopy offers a powerful approach for high-resolution surface characterization.
  • The developed method shows promise for accurate surface profiling even in the presence of noise.