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Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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Atomic force microscopy based manipulation of graphene using dynamic plowing lithography.

Borislav Vasić1, Markus Kratzer, Aleksandar Matković

  • 1Institute of Physics, University of Belgrade, Pregrevica 118, PO Box 68, 11080 Belgrade, Serbia. bvasic@ipb.ac.rs

Nanotechnology
|December 11, 2012
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Summary

Atomic force microscopy (AFM) enables dynamic plowing lithography of graphene. The technique can either strain graphene at moderate forces or cut it at higher forces, with electrical characterization distinguishing separated islands.

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Fabrication of Three-Dimensional Graphene-Based Polyhedrons via Origami-Like Self-Folding

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Area of Science:

  • Materials Science
  • Nanotechnology
  • Surface Science

Background:

  • Graphene's unique properties make it a promising material for nanoelectronic devices.
  • Precise manipulation and patterning of graphene are crucial for device fabrication.
  • Atomic Force Microscopy (AFM) offers high-resolution imaging and manipulation capabilities at the nanoscale.

Purpose of the Study:

  • To investigate dynamic plowing lithography of exfoliated graphene using tapping mode AFM.
  • To explore the influence of applied force on graphene deformation and cutting.
  • To differentiate between mechanically separated and connected graphene regions using electrical characterization techniques.

Main Methods:

  • Tapping mode atomic force microscopy (AFM) for dynamic plowing lithography.
  • Controlled manipulation of the AFM probe to alter graphene sheet shape.
  • Electrical characterization using AFM-based electric force microscopy, Kelvin probe force microscopy, and conductive AFM.

Main Results:

  • Two distinct lithography regimes were identified based on applied force: elastic deformation (0.1% strain) and mechanical cutting.
  • The AFM tip's motion dictates the resulting graphene shape.
  • Electrical characterization successfully distinguished between truly separated graphene islands and those still connected to the substrate.

Conclusions:

  • Dynamic plowing lithography with AFM provides a method for patterning graphene.
  • The applied force is a critical parameter controlling the lithography outcome (deformation vs. cutting).
  • AFM-based electrical techniques are effective for verifying the integrity of patterned graphene structures.