Accelerated autofocusing of off-axis holograms using critical sampling
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Updated: May 15, 2026

Digital Inline Holographic Microscopy (DIHM) of Weakly-scattering Subjects
Published on: February 8, 2014
M Fatih Toy1, Jonas Kühn, Stéphane Richard
1Microvision and Microdiagnostics Group (SCI STI CHD), École Polytechnique Fédérale de Lausanne, Lausanne, CH-1015, Switzerland.
Abstract:
In this Letter we propose a fast off-axis hologram autofocusing (AF) approach that is based on the redundant data elimination by the critical resampling of the contained complex field. Implementation of the proposed methodology enables the real-time AF with up to 12× speed-up factors in comparison to the classical approach. The method is further extended for single-shot physical autofocus of the fluorescence imaging channel of multimodal imaging instruments capable of off-axis hologram acquisition.

