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Updated: May 15, 2026

Determination of the Excitation and Coupling Rates Between Light Emitters and Surface Plasmon Polaritons
Published on: July 21, 2018
Light extraction by directional sources within optically dense media.
1Terahertz Device Corp., Salt Lake City, Utah 84124, USA. nageljr@ieee.org
This study provides exact solutions for light extraction efficiency (LEE) from directional light-emitting devices, improving accuracy beyond isotropic models. The findings help validate simulations and quantify baseline LEE, considering Fresnel reflections at dielectric boundaries.
Area of Science:
- Optoelectronics
- Photonics
- Semiconductor Devices
Background:
- Light extraction efficiency (LEE) is typically measured against isotropic radiators in dielectric media.
- This standard metric is often inaccurate for photonic devices with directional light sources.
Purpose of the Study:
- To derive exact solutions for LEE from directive sources near planar dielectric boundaries.
- To account for Fresnel reflections at the interface for accurate LEE calculations.
- To provide a baseline for validating numerical simulations and source models.
Main Methods:
- Analytical derivation of LEE for directive radiating sources.
- Inclusion of Fresnel reflection effects at the dielectric interface.
- Analysis of four source models: isotropic radiator, Hertzian dipoles (parallel/perpendicular), and Lambertian scatterer.
Main Results:
- Exact LEE solutions were derived for directive sources, improving upon isotropic models.
- Fresnel reflections were quantified, showing negligible impact with large escape cones.
- LEE reduction of 20% or more was observed when the critical angle is below 25°.
Conclusions:
- The derived exact solutions offer a more accurate method for LEE assessment in directional photonic devices.
- These results are crucial for validating computational models and understanding baseline performance.
- The study highlights the significant impact of Fresnel reflections on LEE in specific material systems.
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