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All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
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A subKelvin scanning probe microscope for the electronic spectroscopy of an individual nano-device

T Quaglio1, F Dahlem, S Martin

  • 1Institut Néel, CNRS, Grenoble INP and Université Joseph Fourier, 25 rue des Martyrs, BP 166, 38042 Grenoble, France.

The Review of Scientific Instruments
|January 3, 2013
PubMed

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