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Updated: May 15, 2026

A Novel Technique for Raman Analysis of Highly Radioactive Samples Using Any Standard Micro-Raman Spectrometer

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Indentation device for in situ Raman spectroscopic and optical studies.

Y B Gerbig¹, C A Michaels, A M Forster

¹Ceramics Division, National Institute of Standards and Technology (NIST), Gaithersburg, Maryland 20899, USA. yvonne.gerbig@nist.gov

The Review of Scientific Instruments

|January 3, 2013

Summary

This study presents an in situ indentation device coupled with Raman microscopy for analyzing material deformation. It enables real-time observation of mechanical changes in materials like silicon and polyethylene films.

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Area of Science:

Materials Science
Mechanical Engineering
Spectroscopy

Background:

Instrumented indentation is crucial for studying small-scale material mechanical behavior.
In situ analysis is vital for observing deformation phenomena like phase transformations and molecular changes.
Existing methods often lack the capability for simultaneous mechanical testing and detailed spectroscopic analysis.

Purpose of the Study:

To design, calibrate, and operate a novel indentation device integrated with a Raman microscope.
To enable in situ spectroscopic and optical analysis of materials under contact loading.
To investigate indentation-induced phenomena at the crystallographic and molecular levels.

Main Methods:

Development of a coupled indentation and Raman microscopy system.
Calibration of the indentation device for accurate mechanical testing.
In situ spectroscopic and optical analysis of deformed material regions.
Application to Raman-active, transparent bulk materials, thin films, and fibers.

Main Results:

Successful demonstration of the device's capability for in situ mechanical and spectroscopic analysis.
Observation of indentation-induced phase transformations in silicon thin films.
Analysis of modifications in molecular conformations of high-density polyethylene films under indentation.

Conclusions:

The developed in situ indentation-Raman microscopy system provides a powerful tool for understanding material deformation mechanisms.
This integrated approach allows for detailed investigation of localized mechanical responses and associated structural/chemical changes.
The device facilitates advancements in the study of materials science, particularly for thin films and polymers.