A new approach to reach the best resolution of X-ray microanalysis in the variable pressure SEM

A Zoukel1, L Khouchaf, C Arnoult

  • 1Univ-Lille Nord de France, Ecole des Mines de Douai, 941, rue Charles Bourseul BP 10838, 59500 Douai, France.

Micron (Oxford, England : 1993)
|January 8, 2013
PubMed