Metal-Semiconductor Junctions
Biasing of Metal-Semiconductor Junctions
The Electrical Double Layer
P-N junction
Electrochemical Systems
Charging Conductors By Induction
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Updated: May 15, 2026

Silicon Metal-oxide-semiconductor Quantum Dots for Single-electron Pumping
Published on: June 3, 2015
Akichika Kumatani1, Yun Li, Peter Darmawan
1WPI center for Materials Nanoarchitectronics (WPI-MANA), National Institute of Materials Science (NIMS), Tsukuba, Ibaraki 305-0044, Japan. KUMATANI@wpi-aimr.tohoku.ac.jp
A novel double-layer electrode structure significantly reduces contact resistance in organic field-effect transistors. This breakthrough in organic electronics is achieved by utilizing a metal interlayer, enhancing charge injection efficiency.
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