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Updated: May 15, 2026

Analysis of Contact Interfaces for Single GaN Nanowire Devices
Published on: November 15, 2013
Recombination dynamics in InGaN/GaN nanowire heterostructures on Si(111)
V Cardin1, L I Dion-Bertrand, P Grégoire
1Département de Physique and Regroupement Québécois sur Matériaux de Pointe, Université de Montréal, Case Postale 6128, Succursale Centre-ville, Montréal, QC, H3C 3J7, Canada.
Abstract:
We have performed room-temperature time-resolved photoluminescence measurements on samples that comprise InGaN insertions embedded in GaN nanowires. The decay curves reveal non-exponential recombination dynamics that evolve into a power law at long times. We find that the characteristic power-law exponent increases with emission photon energy. The data are analyzed in terms of a model that involves an interplay between a radiative state and a metastable charge-separated state. The agreement between our results and the model points towards an emission dominated by carriers localized on In-rich nanoclusters that form spontaneously inside the InGaN insertions.
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