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Conductive AFM for CNT characterization

Marius Toader1, Holger Fiedler, Sascha Hermann

  • 1Solid Surfaces Analysis Group, Institute of Physics, Chemnitz University of Technology, Chemnitz 09107, Germany. marius.toader@physik.tu-chemnitz.de.

Nanoscale Research Letters
|January 15, 2013
PubMed

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Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...