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Implementation of a Reference Interferometer for Nanodetection

Implementation of a Reference Interferometer for Nanodetection

Published on: April 26, 2014

Fully referenced single-comb interferometry using optical sampling by laser-cavity tuning.

Simon Potvin¹, Sylvain Boudreau, Jean-Daniel Deschênes

¹Centre d'Optique, Photonique et Laser, Université Laval, Québec G1K 7P4, Canada.

|January 15, 2013

Summary

This summary is machine-generated.

This study presents a two-reference method for fully correcting interferogram errors in optical sampling measurements. A comparison with a one-reference method highlights factors affecting measurement accuracy, crucial for laser-cavity tuning applications.

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Area of Science:

Optical Metrology
Laser Interferometry
Spectroscopy

Background:

Laser instabilities and setup drifts degrade interferometric measurement accuracy.
Optical sampling with laser-cavity tuning offers high-resolution measurements but is sensitive to perturbations.

Purpose of the Study:

To investigate methods for correcting setup and laser instabilities in single-comb interferometric measurements.
To present and compare a two-reference solution with a one-reference approach for full interferogram correction.

Main Methods:

Investigated optical sampling by laser-cavity tuning for interferometric measurements.
Developed and analyzed a two-reference solution for complete interferogram correction.
Compared the two-reference method with a one-reference partial correction technique.

Main Results:

The two-reference solution enables full correction of interferograms, mitigating instabilities.
The one-reference method provides partial correction, with accuracy dependent on parameters like comb bandwidth, laser noise, spectral resolution, scan speed, and delay line length.
Experimental validation was performed using a 10 km fiber delay line and a 100 MHz mode-locked laser.

Conclusions:

A robust two-reference method effectively corrects for instabilities in optical sampling interferometry.
Understanding parameter dependencies is critical for optimizing accuracy in one-reference correction schemes.
The findings are applicable to high-precision measurements utilizing laser-cavity tuning.