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Related Concept Videos

Transmission Electron Microscopy01:15

Transmission Electron Microscopy

In 1931, physicist Ernst Ruska—building on the idea that magnetic fields can direct an electron beam just as lenses can direct a beam of light in an optical microscope—developed the first prototype of the electron microscope. This development led to the development of the field of electron microscopy. In the transmission electron microscope (TEM), electrons are produced by a hot tungsten element and accelerated by a potential difference in an electron gun, which gives them up to 400 keV in...
Preparation of Samples for Electron Microscopy01:20

Preparation of Samples for Electron Microscopy

To be visualized by an electron microscope, either transmission or scanning, biological samples need to be fixed (stabilized) so the electron beam does not destroy them and dried thoroughly (desiccated/dehydrated) so the vacuum does not affect them. Fixation needs to be done as quickly as possible because the sample properties will start changing as soon as it is removed from its natural environment. For example, in a tissue sample, the oxygen levels begin decreasing, causing an altered...
Electron Microscope Tomography and Single-particle Reconstruction01:07

Electron Microscope Tomography and Single-particle Reconstruction

Transmission electron microscopy (TEM) can be used to determine the 3D structure of biological samples with the help of techniques such as electron microscope tomography and single-particle reconstruction. While single-particle reconstruction can examine macromolecules and macromolecular complexes in vitro conditions only, tomography permits the study of cell components or small cells in vivo.
Electron Tomography
Electron tomography can be performed either in TEM or STEM (scanning transmission...

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Related Experiment Video

Updated: May 14, 2026

Single-Digit Nanometer Electron-Beam Lithography with an Aberration-Corrected Scanning Transmission Electron Microscope
10:25

Single-Digit Nanometer Electron-Beam Lithography with an Aberration-Corrected Scanning Transmission Electron Microscope

Published on: September 14, 2018

A method for producing site-specific TEM specimens from low contrast materials with nanometer precision.

Henrik Pettersson1, Samira Nik, Jonathan Weidow

  • 1Microscopy and Microanalysis, Department of Applied Physics, Chalmers University of Technology, SE-412 96 Gothenburg, Sweden.

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|February 6, 2013
PubMed
Summary

A new method uses high-contrast markers for precise transmission electron microscope (TEM) specimen extraction from low-contrast materials using focused ion beam (FIB) milling. This technique ensures accurate sample retrieval without specialized holders.

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Miniaturized Sample Preparation for Transmission Electron Microscopy
09:04

Miniaturized Sample Preparation for Transmission Electron Microscopy

Published on: July 27, 2018

Related Experiment Videos

Last Updated: May 14, 2026

Single-Digit Nanometer Electron-Beam Lithography with an Aberration-Corrected Scanning Transmission Electron Microscope
10:25

Single-Digit Nanometer Electron-Beam Lithography with an Aberration-Corrected Scanning Transmission Electron Microscope

Published on: September 14, 2018

Miniaturized Sample Preparation for Transmission Electron Microscopy
09:04

Miniaturized Sample Preparation for Transmission Electron Microscopy

Published on: July 27, 2018

Area of Science:

  • Materials Science
  • Microscopy
  • Nanotechnology

Background:

  • Transmission Electron Microscopy (TEM) requires high-quality specimens.
  • Extracting specimens from low-contrast materials using Focused Ion Beam (FIB) milling presents significant challenges.
  • Existing methods often lack precision or require specialized equipment.

Purpose of the Study:

  • To develop a high-precision method for TEM specimen extraction.
  • To overcome challenges associated with low-contrast materials in FIB milling.
  • To provide a generally applicable technique for producing high-quality TEM samples.

Main Methods:

  • Developed a technique to create high-contrast markers adjacent to the area of interest.
  • Markers are filled during the deposition of a protective layer.
  • Utilized either Platinum (Pt) or Carbon (C) for markers based on optimal contrast.

Main Results:

  • Successfully enabled precise identification of the area of interest during FIB milling.
  • Ensured accurate extraction of TEM specimens at desired locations.
  • Demonstrated applicability across three diverse material types.

Conclusions:

  • The developed marker-based method significantly enhances precision in TEM specimen preparation.
  • This technique is broadly applicable to FIB/Scanning Electron Microscope users for low-contrast materials.
  • High-quality TEM specimens can be prepared from small features without specialized holders.