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Generalized phase evaluation for stereophotogrammetric correspondence assignment.

Marcus Große1, Martin Schaffer, Bastian Harendt

  • 1Friedrich-Schiller University Jena, Institute of Applied Optics, Jena, Germany. marcus.g@uni-jena.de

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|February 6, 2013
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Summary

This study enhances 3D shape measurement by generalizing phase evaluation in stereophotogrammetry. The new method improves correspondence mapping accuracy for structured illumination techniques.

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Area of Science:

  • Optics and Photonics
  • Computer Vision
  • Metrology

Background:

  • Phase-shifting fringe projection is crucial for 3D shape measurement in profilometry and stereophotogrammetry.
  • Existing phase evaluation schemes vary, impacting the accuracy of correspondence mapping between camera views.
  • The nominal phase value serves as a key image feature for establishing stereo correspondence.

Purpose of the Study:

  • To investigate the role and properties of phase evaluation in stereophotogrammetric correspondence mapping.
  • To generalize the classical phase evaluation function for improved accuracy.
  • To experimentally compare classical and generalized phase evaluation methods.

Main Methods:

  • Analysis of classical phase evaluation function properties for correspondence mapping.
  • Derivation of a generalized phase evaluation function for stereo image sequences.
  • Experimental comparison of correspondence assignment using classical versus generalized phase evaluation.

Main Results:

  • The essential properties of the classical phase evaluation function for accurate correspondence were identified.
  • A generalized phase evaluation function was derived, offering potential for enhanced accuracy.
  • Experimental results demonstrated differences in correspondence assignment between the two methods.

Conclusions:

  • Generalized phase evaluation offers improved accuracy for correspondence mapping in stereophotogrammetry.
  • The derived generalized function is applicable to sequences of stereo images.
  • This work contributes to advancing high-accuracy 3D shape measurement techniques.