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Calculation of the effect of tip geometry on noncontact atomic force microscopy using a qPlus sensor

Julian Stirling1, Gordon A Shaw

  • 1School of Physics and Astronomy, The University of Nottingham, University Park, Nottingham, NG7 2RD, United Kingdom.

Beilstein Journal of Nanotechnology
|February 13, 2013
PubMed

Keywords:
atomic force microscopyforce spectroscopylateral forcesmechanical vibrationsqPlus

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Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...