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Published on: June 28, 2016
X-ray speckle visibility spectroscopy in the single-photon limit
Curt DeCaro1, Vidanage Nuwan Karunaratne, Sambhunath Bera
1Department of Physics, Northern Illinois University, DeKalb, IL 60615, USA.
Speckle visibility spectroscopy now measures dynamics with X-ray scattering. This new method tracks fast diffusion, like latex spheres in glycerol, using short exposures.
Area of Science:
- Physics
- Materials Science
- Spectroscopy
Background:
- Coherent X-ray scattering is a powerful tool for studying material dynamics.
- Traditional methods often require longer exposure times, limiting the study of fast processes.
Purpose of the Study:
- To develop and validate a novel speckle visibility spectroscopy technique for measuring dynamics using coherent X-ray scattering.
- To extend the capabilities of area-detector-based coherent scattering methods to probe faster dynamics.
Main Methods:
- Employed speckle visibility spectroscopy with coherent X-ray scattering.
- Utilized a resonant shutter for exposure times as short as 2 milliseconds.
- Developed an analysis based on the spatial correlation function of individual photon charge droplets for weak scattering data.
Main Results:
- Established a relationship between X-ray contrast in single exposures and the relaxation time of the intermediate scattering function.
- Successfully applied the methodology to measure the diffusion of 72 nm latex spheres in glycerol.
- Demonstrated good agreement between experimental data and theoretical predictions.
Conclusions:
- The developed speckle visibility spectroscopy technique enables the measurement of faster dynamics than previously possible with coherent X-ray scattering.
- This advancement holds significant promise for extending the application of area-detector-based scattering methods.
- The technique offers a new avenue for characterizing dynamic processes in various materials.
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