Atomic Force Microscopy
Scanning Electron Microscopy
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Updated: May 14, 2026

A Novel Method for In Situ Electromechanical Characterization of Nanoscale Specimens
Published on: June 2, 2017
Hu Huang1, Hongwei Zhao, Boda Wu
1College of Mechanical Science & Engineering, Jilin University, Changchun 130025, China. huanghuzy@163.com
A novel two-axis load sensor enables simultaneous measurement of normal and lateral forces, advancing quantitative in situ scratch testing within electron microscopes. This compact sensor overcomes previous limitations, paving the way for detailed nanoscale material analysis.
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