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A Standard and Reliable Method to Fabricate Two-Dimensional Nanoelectronics
Published on: August 28, 2018
Device physics and operation of lateral bulk heterojunction devices
Christopher J Lombardo1, Eric L Danielson, Micah S Glaz
1Microelectronics Research Center, The University of Texas at Austin, Austin, Texas 78758, USA.
The Journal of Physical Chemistry. B
|March 2, 2013
Summary
Lateral bulk heterojunction (BHJ) devices reveal charge transport and recombination in organic photovoltaic (OPV) materials. New methods measure space charge regions and carrier drift lengths, confirming bimolecular recombination as a bulk property.
Area of Science:
- Materials Science
- Organic Electronics
- Photovoltaics
Background:
- Lateral bulk heterojunction (BHJ) devices offer a novel approach to characterizing charge transport and recombination in organic photovoltaic (OPV) materials.
- Understanding these properties is crucial for improving OPV device efficiency and stability.
Purpose of the Study:
- To numerically simulate and experimentally verify different charge transport regimes in lateral BHJ devices.
- To investigate the lateral extents of space charge regions and their relationship to carrier drift lengths.
- To determine the mechanism of bimolecular recombination in OPV materials.
Main Methods:
- Numerical simulations to model charge transport within lateral BHJ structures.
- Confocal microscopy and steady-state current-voltage measurements on nanofabricated devices.
- Analysis of space charge region extents and recombination mechanisms.
Main Results:
- Three distinct charge transport regimes were identified in lateral BHJ devices.
- Experimental results confirmed simulation findings, with space charge regions measuring approximately 1-5 μm.
- Bimolecular recombination was confirmed as an intrinsic bulk material property.
Conclusions:
- Lateral BHJ devices provide valuable insights into in-plane charge transport and recombination in OPV films.
- These findings complement traditional vertical-device measurements.
- The developed methods enable a more comprehensive characterization of OPV material properties.
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