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Updated: May 13, 2026
06:56
Micro/Nano-scale Strain Distribution Measurement from Sampling Moiré Fringes
Published on: May 23, 2017
In-plane displacement measurement in vortex metrology by synthetic network correlation fringes
Luciano Angel-Toro1, Daniel Sierra-Sosa, Myrian Tebaldi
1Grupo de Óptica Aplicada, Departamento de Ciencias Básicas, Universidad EAFIT, Medellín, Colombia. langel@eafit.edu.co
Summary
This study introduces an enhanced vortex metrology method for precise in-plane displacement measurement. The technique utilizes Fourier analysis and vortex tracking for improved accuracy across a wider range of displacements, even with decorrelated speckle patterns.
Area of Science:
- Optical Metrology
- Fourier Optics
- Image Analysis
Background:
- Vortex metrology offers an alternative to speckle photography for displacement analysis.
- Existing methods have limitations in measuring smaller displacements or highly decorrelated patterns.
Purpose of the Study:
- To present an enhanced method for measuring uniform in-plane displacements.
- To improve accuracy and extend the measurable displacement range in vortex metrology.
Main Methods:
- Application of Fourier optics techniques for displacement analysis.
- Fourier analysis performed from vortex networks for smaller displacements.
- Determining subpixel locations and tracking homologous vortices onto a plane.
Main Results:
- High-quality fringe systems can be synthesized and analyzed.
- Accurate measurement in an extended range of displacements.
- Effective measurement for highly decorrelated speckle patterns.
Conclusions:
- The enhanced method provides accurate in-plane displacement measurements.
- The technique is suitable for a broader range of displacement magnitudes and speckle conditions.
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