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Updated: May 13, 2026

Micro/Nano-scale Strain Distribution Measurement from Sampling Moiré Fringes
Published on: May 23, 2017
Note: reducing polarization induced sidebands in Rayleigh backscattering spectra for accurate distributed strain
Zhenyang Ding1, X Steve Yao, Tiegen Liu
1College of Precision Instrument and Opto-Electronics Engineering, Tianjin University, Tianjin 300072, China.
Abstract:
We describe a phenomenon called polarization-induced sidebands (PIS) in Rayleigh backscatter spectra (RBS) and discuss its deteriorating effects on the distributed strain measurement using an optical frequency-domain reflectometry. We propose using a special polarization diversity detection scheme to remove PIS and successfully demonstrate accurate distributed strain measurement in the range of 0.75 με-225 με in a 50 m standard single mode fiber, with a good linearity between the strain and the spectra shift in RBS.

