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Sub-surface imaging of carbon nanotube-polymer composites using dynamic AFM methods
Maria J Cadena1, Rocio Misiego, Kyle C Smith
1Department of Electrical and Electronic Engineering, Universidad de los Andes, Bogota, Colombia.
Nanotechnology
|March 13, 2013
Summary
Kelvin probe force microscopy (KPFM) offers high-contrast sub-surface imaging of carbon nanotube (CNT) networks in polymer nanocomposites. This dynamic atomic force microscopy technique reveals CNT dispersion and connectivity, crucial for sensor and energy storage applications.
Area of Science:
- Materials Science
- Nanotechnology
- Surface Science
Background:
- Polymer nanocomposites require detailed characterization of internal structures for optimal performance.
- Understanding the dispersion and connectivity of carbon nanotubes (CNTs) within polymer matrices is critical for applications.
- Sub-surface imaging techniques are needed to complement surface analysis of nanocomposites.
Purpose of the Study:
- To demonstrate high-resolution sub-surface imaging of CNT networks in polymer nanocomposites using dynamic atomic force microscopy (AFM).
- To compare the efficacy of DC-biased amplitude modulated AFM (AM-AFM), electrostatic force microscopy (EFM), and Kelvin probe force microscopy (KPFM) for sub-surface imaging.
- To establish KPFM as a robust method for characterizing CNT dispersion and connectivity.
Main Methods:
- Dynamic atomic force microscopy (AFM) in a single-pass configuration.
- Comparison of AM-AFM, EFM, and KPFM techniques for sub-surface imaging.
- Analysis of capacitance gradient (∂C/∂d) images from KPFM to assess CNT dispersion and connectivity.
Main Results:
- KPFM, measuring the capacitance gradient (∂C/∂d) at the second harmonic, provides high-contrast, surface-condition-independent images of sub-surface CNT networks.
- AFM-based sub-surface methods effectively probe deep enough to resolve clustered networks relevant to conductivity percolation.
- The proposed analysis of ∂C/∂d images allows for characterization of CNT dispersion and connectivity.
Conclusions:
- Kelvin probe force microscopy (KPFM) is the superior AFM technique for high-resolution sub-surface imaging of CNTs in polymer nanocomposites.
- Dynamic AFM-based sub-surface characterization enables assessment of dispersion and connectivity, critical parameters for nanocomposite applications.
- This work opens possibilities for advanced characterization of nanostructured composites for sensors and energy storage.

