Related Experiment Video
Updated: May 13, 2026
Digital Inline Holographic Microscopy (DIHM) of Weakly-scattering Subjects
Published on: February 8, 2014
Separation of overlapped particles in digital holographic microscopy
Ahmed El Mallahi1, Frank Dubois
1Université Libre de Bruxelles, Microgravity Research Center, 50 Av F Roosevelt, CP 165/62, B-1050 Brussel, Belgium.aelmalla@ulb.ac.be
Abstract:
In this paper, we present a procedure to separate aggregates of overlapped particles in digital holograms, based on a focus plane analysis applied to each particle. The method can be applied either on phase or on amplitude objects, according that each object has a border in one focus plane. Numerical simulations are performed to quantify the robustness of the process by increasing the overlapping areas between the particles. The separation algorithm is successfully demonstrated experimentally on different types of aggregates.
Related Concept Videos
01:37Super-resolution Fluorescence Microscopy
01:26Phase Contrast and Differential Interference Contrast Microscopy
In-phase-contrast microscopes, interference between light directly passing through a cell and light refracted by cellular components is used to create high-contrast, high-resolution images without staining. It is the oldest and simplest type of microscope that creates an image by altering the wavelengths of light rays passing through the specimen. Altered wavelength paths are created using an annular stop in the condenser. The annular stop produces a hollow cone of...