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Updated: May 13, 2026

Miniaturized Sample Preparation for Transmission Electron Microscopy
Published on: July 27, 2018
Cross-section metal sample preparations for transmission electron microscopy by electro-deposition and
1National High Magnetic Field Laboratory, Tallahassee, FL 32310, USA.
Abstract:
A cross-section sample preparation technique is described for transmission electron microscopy studies of metallic materials. The technique uses jet electro-polishing for the final perforation. Examples are provided of using this technique for copper-support/copper-films/copper-support multilayer structures, grown by electro-deposition. The samples prepared by our current technique are compared with the ones made by ion-milling. The technique is also applicable to materials which are susceptible to ion beam and thermal damages.
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