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Related Concept Videos

Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
Preparation of Samples for Electron Microscopy01:20

Preparation of Samples for Electron Microscopy

To be visualized by an electron microscope, either transmission or scanning, biological samples need to be fixed (stabilized) so the electron beam does not destroy them and dried thoroughly (desiccated/dehydrated) so the vacuum does not affect them. Fixation needs to be done as quickly as possible because the sample properties will start changing as soon as it is removed from its natural environment. For example, in a tissue sample, the oxygen levels begin decreasing, causing an altered...
Overview of Electron Microscopy01:25

Overview of Electron Microscopy

The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.

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Updated: May 12, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
11:14

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Published on: May 28, 2016

Exploring aberration-corrected electron microscopy for compound semiconductors.

David J Smith1, Toshihiro Aoki, John Mardinly

  • 1Department of Physics, Arizona State University, Tempe, AZ 85287-1504, USA. david.smith@asu.edu

Microscopy (Oxford, England)
|March 29, 2013
PubMed
Summary
This summary is machine-generated.

Aberration-corrected electron microscopes (ACEMs) now resolve atomic structures in semiconductors. These advanced ACEMs are powerful tools for studying defects and interfaces in elemental and compound semiconductor materials.

Keywords:
aberration-corrected electron microscopycompound semiconductordumbbell imagingpolarity reversal

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Area of Science:

  • Materials Science
  • Solid-State Physics
  • Electron Microscopy

Background:

  • Aberration-corrected electron microscopes (ACEMs) enable atomic-resolution imaging.
  • Elemental and compound semiconductors are crucial electronic materials.

Purpose of the Study:

  • To provide an overview of ACEM techniques for semiconductor characterization.
  • To present case studies of ACEM analysis at semiconductor interfaces.

Main Methods:

  • Overview of off-line (software) and on-line (hardware) ACEM techniques.
  • Probe-corrected ACEM studies of ZnTe/InP and ZnTe/GaAs heterostructures.

Main Results:

  • ACEMs can resolve individual atomic columns with correct interatomic spacings.
  • Detailed structural arrangements at defects and interfaces in semiconductors can be determined.
  • Exploratory studies demonstrated ACEM capabilities for interfacial defect analysis.

Conclusions:

  • ACEMs are powerful instruments for advanced semiconductor characterization.
  • Further development and application of ACEMs are expected for materials research.