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Updated: May 12, 2026

08:12
Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on: December 5, 2015
Charge-transfer interaction between few-layer MoS2 and tetrathiafulvalene
Sunita Dey1, H S S Ramakrishna Matte, Sharmila N Shirodkar
1Chemistry and Physics of Materials Unit, Jawaharlal Nehru Centre for Advanced Scientific Research, Jakkur P.O., Bangalore-560 064, India.
Chemistry, an Asian Journal
|April 18, 2013
Summary
No abstract available in PubMed .
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