Collecting optical coherence elastography depth profiles with a micromachined cantilever probe

Dhwajal Chavan1, Jianhua Mo, Mattijs de Groot

  • 1Department of Physics and Astronomy and LaserLaB, VU Amsterdam, Amsterdam, The Netherlands.

Optics Letters
|May 2, 2013
PubMed
Summary

We developed a new instrument combining optical coherence elastography and atomic force microscopy for high-resolution subsurface deformation analysis. This technique precisely measures material properties with nanoscale accuracy.