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Updated: May 11, 2026

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection
Published on: June 13, 2023
1PicoCal, Inc., 333 Parkland Plaza, Ann Arbor, MI48103 ; EI-EWI, Delft University of Technology, Mekelweg 4, 2628CD, Delft, The Netherlands.
This study integrates heating and deflection-sensing elements onto microcantilever arrays for enhanced scanning probe microscopy. This innovation enables high-throughput, nanometer-resolution imaging and precise material property measurements.
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